Refractive Index Detector

Refractive Index Detector RID-20A

Refractive Index Detector RID-20A Spincotech

Inheriting the stability and extensibility that are the strengths of the Prominence series, the new RID-20A model of differential refractive index detector is designed with a new reference-cell auto-purge feature and validation support function.

Reduced Stabilization Time and Improved Baseline Stability :After 30 Minutes Power on

The RID-20A reduces the time to stabilization after power-on dramatically by utilizing dual temperature control for the optical system. The stable baseline provides the accurate analysis of the molecular weight distribution.

Reduced Stabilization Spincotech
Short Warm-up Time and Improved Baseline Stability

The optical system is housed inside a dual-temperature-controlled block. The temperature of the incoming mobile phase is controlled in two stages; consequently, the stabilization time is significantly shorter than with conventional systems. This dual-temperature control also helps significantly reduce baseline drift, thus increasing the reliability of analysis data.

Short Warm-up Time and Improved Spincotech
Short Warm-up Spincotech
Shimadzu's Proprietary Technology Supports Highly Sensitive Analysis to Preparative Analysis Applications

The four-partition photodetector in the RID-20A allows a wide refractive index range (0.01 to 5000 μRIU). The single detector supports all applications from highly sensitive measurements to preparative measurements using the three operation modes shown below.

Shimadzu's Proprietary Spincotech
A (Analytical) ModeHigh-sensitivity to general-purpose analysis
P (Preparative) ModeHigh-concentration analysis, semi-preparative analysis (up to 20 mL/min)
L (Large-prep.) ModeFlow selection block allows large-volume preparative analysis. (up to 150 mL/min)
4-Partitioned Detector Element

The detector element of the RID-20A is partitioned into four parts, and the parts used can be changed electrically. In A mode (for high-sensitivity analysis), the partitions are grouped left-right (combinations of A+C and B+D), and in P and L modes (for preparative analysis), the partitions are grouped top-bottom (combinations of A+B and C+D). In P and L modes, because measurement is possible regardless of the position of the element’s center line, large refractive indexes for high-concentration samples can be handled.

4-Partitioned Detector Element Spincotech